NATIONAL SEMICONDUCTOR &ndash LOGIC DATABOOK Vol. II © 1984 (Catlett, VA)

NATIONAL SEMICONDUCTOR &ndash LOGIC DATABOOK Vol. II © 1984

Local pick-up preferred (please call first) but will ship at the buyer s expenseKingston Books 15 IMG_7474Illustrated Charts Graphs Sample Circuits Typical Performance Characteristics of each Device Physical Dimensions and Package Outlines Function TableGuide to Bipolar Logic Device FamiliesSince the introduction or the first saturating logic bipolar integrated circuit family (DM54 DM74) there have been many developments in the process and manufacturing technologies as well as the circuit design techniques which have produced new generations (families) of bipolar logic devices. Each generation has advantages and disadvantages over the previous generations. Today National provides six bipolar logic families. These are seen below number 2 through 7. The internal structure of each is displayed in this book. In addition the electrical characteristics of each are shown over a range of operating temperatures.Understanding when a part fails the limit and which forcing functions are really tighter is critical when determining if an IC device is good or bad.All of National s databook parameters are defined and guaranteed for worst-case testing. Input loading currents (fan in) are tested at the input and Vcc levels that most increases that loading while the output drive capability (fan out) is tested at the input and Vcc levels that most decrease that capability. Icc is tested with the input conditions and Vcc level that yield the greatest Icc value and Vclamp is tested such that the negative voltage is maximized for a given clamp current. The fan-in and fan-out specs are contained in the IiH IOH IiL IOL values. To guarantee these fan-in and fan-out limits at 10 the IOL must be at least 10 times the IIL and the IOH must be at least 10 times the IIH. Be aware that the fan-in and fan-out specifications are valid only within a given device family. The standard input loading and output drives are shown on Table 1 (of the text).When dealing with any kind of device specification it is important to note that there exists a pair of testing conditions that define the test the forcing function and the limit (these are shown listed Table 1).Note There is a Glossary of Terms in Chapter 1 on page 17Contents by Chapter (in brief)Introduction to Bipolar Logic Advanced Low Power Schottky Advanced Schottky Low Power Schottky Schottky TTL Low Power Appendices Physical Dimensions Paperback 1883 pages